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Kohara, Shinji*; Oishi, Yasuo*; Takata, Masaki*; Yoneda, Yasuhiro; Suzuya, Kentaro
Nihon Kessho Gakkai-Shi, 47(2), p.123 - 129, 2005/04
The use of high-energy (E 
50 keV) X-rays from SPring-8 allows us to perform X-ray diffraction experiments on disordered materials with the following advantages: high resolution in real space due to the wide range of scattering vector, small correction terms (particularly the absorption correction), and fast diffraction measurement with small amount of samples. Recently, high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed neutron source to provide more detailed and reliable structural information than has hitherto been available. Furthermore, the use of reverse Monte Carlo modelling and PDF (pair distribution function) simulation based on high-energy X-ray diffraction data have succeeded in illustrating 3-dimensional structure of disordered materials and disorder in crystalline materials.
Suzuya, Kentaro; Kohara, Shinji*
Materia, 41(3), p.206 - 215, 2002/03
With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices, the high-energy (E 30 keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. Recently, the high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available. We have developed a two-axis diffractometer for glass, liquid and amorphous materials at the SPring-8 high-energy X-ray diffraction beamline BL04B2. Furthermore, we have succeeded to analyze the intermediate-range order of network forming glasses, SiO
, BO
, and GeO by the reverse Monte Carlo (RMC) modelling technique with special focused on the ring structures using both high-energy X-ray and neutron diffraction data.
Kohara, Shinji*; Suzuya, Kentaro
Physics and Chemistry of Glasses, Vol.43C 2002, p.51 - 54, 2002/00
With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices, the high-energy (E 30keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. Recently, the high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available. We have developed a two-axis diffractometer for glass, liquid and amorphous materials at the SPring-8 high-energy X-ray diffraction beamline BL04B2. Furthermore, we have succeeded to analyze the intermediate-range order of a typical network forming glass, silica (SiO), by reverse Monte Carlo (RMC) modelling technique with special focused on the ring structures using both high-energy X-ray and neutron diffraction data.
Kohara, Shinji*; Suzuya, Kentaro
Hoshako, 14(5), p.365 - 375, 2001/11
no abstracts in English
